ITSW 2008 - Call for Papers

CALL FOR PAPERS

Scope -- Author Information -- Committees

Scope

Theme: At-Speed Scan: Challenges and Opportunities

Since the inception of ITSW in Santa Barbara in 1994 chip geometries have shrunk from 500 to 65 nanometers with 45 nanometers on the near horizon. Digital circuit speeds have moved from the 100-200 MHz range to 2-3 GHz and higher. This amazing shrinkage and speedup has been spurred by innovative algorithms, tools and methodologies in all aspects of digital chip design and manufacturing. The widespread use of all aspects of Test Synthesis coupled with powerful pre-silicon verification approaches has been able to keep up with increasing chip complexity.

This year’s workshop will focus on at-speed scan tests, looking at various issues like hardware support, yield loss, test power, defect coverage, pseudo-functional tests and explore whether it is possible to replace functional delay tests with at-speed scan and still maintain product quality. As always, ITSW is open to all submissions in the area of test, including, but not limited, to the following:

Register Transfer Level DFT
High-Level/Behavioral Test Synthesis
System-on-a-Chip (SoC) DFT
Memory and Logic BIST
Test Synthesis for Debug and Diagnosis
DFT for Mixed-Signal Circuits
Test Resource Partitioning
Functional Verification
Power and Noise-Aware Test
Design for Reliability
High-speed I/O test
Reducing the Cost of Test
Design for Manufacturing and Yield
Board and System Test
SER / Concurrent Error Detection
Test Synthesis for Reconfigurable Logic

For more information, please refer to the web site: http://www.tttc-itsw.org.

Author Information

top

To present recent research results at the workshop, please submit an extended abstract, one to three pages long, in PDF format by January 9, 2008. Acceptance notifications will be sent out on February 27, 2008. Please include the names, affiliations, and full contact information of all authors. Also, indicate which author will be the speaker if the abstract is accepted for presentation. To support open discussion, no proceedings of the workshop will be published. As in previous years, ITSW will present a BEST Student Paper Award to encourage student participation in the workshop.

For general information, contact:

Nilanjan Mukherjee, General Chair
Mentor Graphics Corporation
Wilsonville, OR 97070
Phone: +1 (503) 685-1721
Fax: +1 (503) 685-4729
Email: GeneralChair@tttc-itsw.org

Submit extended abstracts via email to:

Nur Touba
Electrical and Computer Engineering
University of Texas, Austin, TX
Phone: +1 (512) 232-1456
Fax: +1 (512) 471-5532
Email:ProgramChair@tttc-itsw.org

Committees

top

General Chair
N. Mukherjee – Mentor G.

Past General Chair
S. Patil – Intel

Vice Chair
J. Dworak – Brown U.

Program Co-Chairs
N. Touba – U. Texas, Austin
S. Chakravarty - LSI

Panels Chair
V. Chickermane – Cadence

Publicity Chair
A. Jas – Intel

Finance Chair
C. Barnhart – Silicon Aid

Local Arrangements Chair
L. C. Wang – UC SB

European Liaison
M. Zwolinski – U. Southampton

Asian Liaison
C. W. Wu – Nat. Tsing Hua U.

Program Committee
M. Abadir – FreeScale
R. Aitken – ARM
K. Balakrishnan – AMD
S. Blanton – CMU
D. Burek – Magma
K. Chakrabarty – Duke U.
K.-T.Cheng – UC SB
A. Crouch – Inovys
R. Datta – TI
S. Davidson – Sun Micro.
C. Dixit – LSI
D. Goswami – Synopsys
A. Guettaf – Broadcom
M. Hsiao – Virginia Tech.
K. Iwasaki – Tokyo Metro. U.
R. Kapur – Synopsys
M. Laisne – QualComm
K.-J. Lee – Nat. Cheng-Kung U.
A. Majumdar – Sun Micro.
S. Mitra - Stanford
K. Mohanram - Rice U. Texas
M. Nourani –U. Texas, Dallas
A. Orailoglu – UC San Diego
B. Pouya – Freescale
J. Qian – Cisco
J. Rajski – Mentor Graphics
S. M. Reddy – U. Iowa
M. Tahoori – Northeastern U.
S. Tragoudas – S. Illinois U.
H. Walker – Texas A&M U.

For more information, visit us on the web at: http://www.tttc-itsw.org

The 15th International Test Synthesis Workshop (ITSW 2008) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	14th International Test Synthesis Workshop (ITSW 2008) April 7-9, 2008 University of California Santa Barbara, California, USA http://www.tttc-itsw.org